Samer Amireh

Samer Amireh is a seasoned engineering professional with over 29 years of experience in test development and management. Currently serving as a Senior Test Development Engineering Manager at Texas Instruments since September 2011, Samer leads the World Wide Test Team, overseeing test strategy and DFT methodologies for the Wide Vin product line, while also focusing on automotive best practices. Prior to this role, Samer worked at National Semiconductor, where responsibilities included mentoring teams, collaborating with various engineering departments, and enhancing test engineering competencies. Samer holds a Bachelor of Science in Electrical Engineering with a specialization in Analog from San Francisco State University.