Eric CW Chan is a Senior Manager in Design For Test (DFT) CAD with extensive experience in test engineering and program management. They have a strong background in developing and optimizing functional test patterns, conducting ASIC characterization, and leading teams in new product introductions across various projects. Previously, Eric served in multiple technical roles at AMD and ATI Technologies Inc., where they contributed to improving test coverage and production yield. Eric earned a Bachelor of Applied Science in Computer Engineering from the University of Toronto.
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