Mu bin

Mu Bin is an experienced application engineer with a strong background in IC test program development and maintenance. Current employment at Advantest as an 应用工程师 began in March 2022. Previously served as an Application Engineer at Teradyne from April 2012 to March 2022 and worked as a Test Engineer at AltoBeam Inc. from March 2011 to April 2012, where responsibilities included developing and maintaining digital IC test programs using the J750 platform. Prior to that, Mu Bin contributed as an IC test engineer at Actions Semiconductor for a brief period in 2010 and spent four years at Freescale Semiconductor developing analog IC test programs with ATE. Academic credentials include a Bachelor’s degree in Micro Electronics from Tianjin University, obtained in 2006.