Hoo Kim is an experienced engineer and academic with a diverse background in signal integrity, systems testing, and electrical engineering. Hoo has held positions as a Senior Engineer at Keyssa Inc. and Silicon Image, focusing on signal integrity, silicon validation, and high-speed chip characterization. Currently serving as a Sr. Signal Integrity Engineer at Amazon, Hoo also has experience as an Associate and Assistant Professor at LeTourneau University. Hoo's academic credentials include a PhD in Electrical and Computer Engineering from The University of Texas at Austin. Additional experiences include internships at Samsung Advanced Institute of Technology, Broadcom, and engineering roles in various high-tech companies. Hoo's work includes significant contributions to RF signal processing, EMI analysis, and antenna design.
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