Amit Siany is currently a Senior CD-SEM Metrology Lead at Applied Materials, where they specialize in application development for both R&D and high-volume manufacturing environments within the semiconductor industry. Previously, Amit held positions including CD-SEM Application Specialist and Product Marketing Manager at ASML. Amit earned a Bachelor of Science degree in Communication Systems Engineering from Ben-Gurion University of the Negev between 1999 and 2003.
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