Yuval Bar is currently a Product Line Manager at Applied Materials, focusing on Mask CD-SEM and DR-SEM technologies. Previously, Yuval held various roles including Sr. Metrology Engineer at Micron Technology, Analytical Laboratory Manager at National Semiconductor and Tower Semiconductor, as well as positions at Nikon Instruments, ASML, IBM, and GLOBALFOUNDRIES. With extensive experience in semiconductor metrology and process optimization, Yuval has managed teams, projects, and budgets while developing advanced metrology techniques. Yuval's educational background includes studying at the Technion-Machon Technologi Le' Israel.
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