Alejandro Arrizabalaga is an experienced System Engineer at ASML since May 2007, specializing in overlay for DUV systems and defining the architectural roadmap for metrology solutions in EUV scanners. Previous roles at ASML include Senior Architect in Metrology, Metrology Architect, Overlay Architect, and Design Engineer, focusing on research and development in overlay. Prior to ASML, Alejandro served as a Postdoctoral Researcher at NIKHEF, conducting scientific research on elementary particle behavior in extreme environments. Alejandro earned a Ph.D. in Theoretical Physics from the University of Amsterdam, alongside M.Sc. degrees in Solid State Physics from the University of Groningen and the University of Copenhagen, and a B.Sc. in Physics from Universidad del País Vasco/Euskal Herriko Unibertsitatea.
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