Arjen Storm is a System Architect at ASML, where they have worked since 2019. Previously, Arjen held roles at Mapper from 2012 to 2019, leading various teams focused on MEMS metrology and beam measurement, and served as a Senior Design Engineer at Bruker AXS from 2001 to 2009, specializing in X-ray diffraction technology. Arjen’s career also includes experience as a Process Engineer at ASM from 1996 to 2001, where they contributed to the development of semiconductor fabrication processes. They studied applied physics at Delft University of Technology, obtaining a Master’s degree in 1996, following an education in Electronics at MTS and earlier studies at De Haagse Hogeschool.
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