Bert Verstraeten

Bert Verstraeten is currently a System Function Architect for YieldStar Applications at ASML, where they focus on advancing optical metrology tools. Previously, Bert held roles as an Application Design Engineer and Project Leader in In-Device Metrology at ASML, having designed optimization algorithms for metrology applications. Bert completed a PhD in Applied Physics at KU Leuven, where they developed a full-optical diagnostic method for characterizing thermoelastic properties of coatings used in nuclear reactors. Additionally, Bert earned a Master of Science and a Bachelor of Science in Physics from Katholieke Universiteit Leuven and Universiteit Hasselt, respectively.