Christian Leewis is a Senior Design Engineer at ASML, where they have worked since 2012, focusing on metrology. Prior to this role, they were a Design Engineer at the same company. Christian completed a postdoctoral fellowship at Technische Universiteit Eindhoven from 2003 to 2006, specializing in thin film and nanoparticle surface studies. They earned a PhD in Physics from Eindhoven University of Technology, where they studied from 1993 to 2003, and they also participated in exchange programs at the University at Albany and the National University of Singapore.
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