Georgi N. is a Senior Architect at ASML, specializing in defectivity for the High-NA EUV scanner EXE5000. Georgi developed a Variable Temperature STM for their PhD, leading to a patent in nano-patterning techniques. Prior to ASML, Georgi held positions at Intel, Cymer, and various academic institutions, demonstrating expertise in process engineering and vacuum systems. Georgi completed a Ph.D. in Physics at the University of New Hampshire and a Master's Degree at Sofia University St. Kliment Ohridski.
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