Hyungwoo Lee is a Senior Lithography System Performance Engineer at ASML, currently working in the Wafer Metrology Group within the D&E Cross Product Performance Department. With over 10 years of experience in semiconductor metrology, they previously served as a Senior Metrology Application Engineer at FormFactor Inc. and held a senior engineering role at Samsung Electronics, where they developed metrology processes for advanced memory devices. Hyungwoo obtained a Ph.D. in Mechanical Engineering from Yonsei University, concentrating on optical spectroscopy and metrology.
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