Jasper van Rens

Jasper van Rens is a Research Scientist at ASML, working since August 2019 in the SEM and process modeling group, focusing on enhancing the accuracy and precision of scanning electron microscopy for semiconductor wafer metrology. Prior to this role, Jasper completed a PhD in Applied Physics at Eindhoven University of Technology from September 2013 to September 2019 under the guidance of Professor Jom Luiten, focusing on coherence and quantum technology. During earlier studies, Jasper conducted a master's project on laser-cooling a Rubidium atomic beam to develop a high-brightness ion source and served as a Visiting Research Scholar at Princeton Plasma Physics Laboratory, where research involved ray-tracing simulations related to nuclear fusion reactor diagnostics. Jasper holds both a Master of Science and a Bachelor of Science in Applied Physics from Eindhoven University of Technology.