Jiyou Fu is currently working as a Principal System Engineer at ASML, focusing on overlay target optimization for next generation overlay metrology tool. Prior to this, Jiyou worked at Apple as a Senior Test Engineer, where they were responsible for the automated active alignment and assembly of the iPhone X's TrueDepth Depth Sensing system. They also worked at KLA-Tencor as a Senior System Design Engineer, developing complex optical metrology systems for critical dimension measurement. Jiyou holds a PhD in Precision Engineering from the University of North Carolina at Charlotte, a Master's degree in Computer Science from the same institution, and a Bachelor's degree in Precision Instrumentation from Tianjin University.
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