Rik van der Weij is currently the Architect Metrology Image Align EUV at ASML, where they have contributed to various roles since 2008, including Software Engineer and CS Application Engineer Overlay. They provided global customer support and played a key role in the rollout of new products, while also focusing on optimizing process control for customers. Prior to their career at ASML, Rik served as a Student Assistant at the University of Amsterdam, supporting second-year students in Image Perception. Rik earned a Master of Science in Mathematics from the University of Amsterdam after completing their VWO at Murmellius Gymnasium Alkmaar.
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