Sjoerd Hack is a Senior Metrology Engineer at ASML, where they lead technical competence initiatives. They have completed a PhD in computational nanophotonics at the University of Twente, focusing on developing physical models and numerical methods for light propagation at the nanoscale. Sjoerd has also held various roles in academic settings, including teaching assistant and faculty council member, while actively engaging in numerous internships and organizational activities related to mathematics and engineering.
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