Thomas Huisman is an accomplished researcher currently at ASML since February 2017, focusing on modeling scanning electron microscopy (SEM) image formation to enhance SEM metrology and inspection, while also overseeing a team of approximately 10 individuals since 2019. Prior to this role, Thomas served as a PhD candidate and postdoctoral researcher at FOM, conducting research at Radboud University on the dynamical properties of magnetic materials through the combination of optical and terahertz light pulses. Additional experience includes serving as a research assistant at the University of Twente and supervising first-year physics experimental courses at the same institution. Thomas holds a degree from the University of Twente and completed secondary education with a focus on Beta sciences at Goois Lyceum.
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