TL

Thomas Laoh

Project Leader EUV Reticle defectivity

Thomas Laoh is a skilled project leader specializing in EUV reticle defectivity at ASML, where they focus on innovative solutions to maintain cleanliness on critical surfaces in lithography. Previously, Laoh held roles as a team leader and main deliverable owner, overseeing project planning and stakeholder management for contamination control efforts. They gained valuable experience as a graduate student intern, utilizing computational fluid dynamics to research water flow in wafer table designs, and conducted an internship at CIRA, studying ice accretion effects on turboprop aircraft propeller blades. Laoh earned a Master’s Degree in Engineering Fluid Dynamics and a Bachelor’s Degree in Mechanical Engineering from the University of Twente.

Location

Utrecht, Netherlands

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