Wade Chien is a system engineer at ASML, specializing in multi-beam and single-beam SEM electronics design with a focus on ultra-low noise and high-speed scanning for metrology and high-throughput inspection applications. Prior to joining ASML in 2020, Wade worked as a hardware design engineer at Test Research, Inc. from 2006 to 2011 and served as a senior system application engineer at Novatek for a brief period in 2011. Wade also held the position of senior electronics design engineer at Hermes-Microvision, Inc. from 2011 to 2018. Wade earned a Master of Engineering in Electrical and Electronics Engineering from National Cheng Kung University in 2005.
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