Wim Coene

Wim Coene is a Part-Time Professor at TU Delft, where they have been teaching since 2015 in the Department of Imaging Physics, focusing on optics for wafer metrology in lithography for semiconductor manufacturing. Coene has served as Director of Research on Sensors, Metrology, and Computational Modeling at ASML since 2009. They held the position of Part-Time Professor in Lithographic Process Control at TU-Eindhoven from 2009 to 2015 and worked as a Research Fellow at Philips Research from 1988 to 2007. Coene earned a Doctorate in Physics from the University of Antwerp between 1978 and 1982.