Yi-Hsien Yu

Yi-Hsien (Ethan) Yu is currently an eBeam metrology product architect at Hermes-Microvision, Inc., an ASML company, where they specialize in E-beam metrology and defect inspection technology for the semiconductor industry. They previously held roles as a Senior Application Engineer and a Research Assistant at Texas A&M University. Yu earned a Doctor of Philosophy (Ph.D.) in Materials Science Engineering from Texas A&M University and holds a Master of Science (M.S.) in Environmental Engineering Technology from National Taiwan University, along with a Bachelor's degree from National Cheng Kung University.