Are you testing DDR, SoC, FPGA, image sensors… ?
BiBench provides innovative solutions for their implementation, test systems, dynamic burn-in / life-test, etc.
 
BiBench offers lightweight innovative systems for fast / complex digital electronic components, testing under external stress and in actual functional situation. 
For thermal test, thanks to a patented housing, our systems are suitable to make dynamic tests under high (or low) temperature, like Burn-In, Life-Test and other functional tests under thermal stress.
Bibench also provides leading solutions in the field of radiation tests for VLSI (SoC, FPGA...), memory (DDR, NAND-Flash...), image sensors, etc.

Breaking with existing heavy and expensive solutions, BiBench systems brings innovative, affordable and reliable test answers, already approved by major companies.

Founded in 2013 and based in Toulouse, BiBench is a small, agile, and innovative company composed entirely of engineers, which works with leading European players in the space sector.

BiBench Systems

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BiBench Systems

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