Our innovative video-rate scanning probe microscope images cm2 areas with nanometre resolution and can track dynamic processes in real time. The product of 10 years of intensive development, our technology is fundamentally different from traditional atomic force microscopes but produces images and data with similar resolution and accuracy to the best competing high-speed AFMs in only a 1,000th of the time!

Creative researchers are already using our instruments to carry out analyses that were previously thought impossible across diverse fields from genomics to 2D materials, batteries and semiconductors.

We continue to develop new technologies and will be launching a scanning probe (patent pending) version of our microscope soon for semiconductor wafer measurements.

Contact us for more details and a demonstration on your own samples.

Bristol Nano Dynamics

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