Brian Oh

Brian Oh is currently a Staff DFT Engineer at Broadcom, specializing in Design For Testability and Design For Debug. With a strong academic background, they earned a Doctor's Degree in DFT and Post Silicon Debug from Yonsei University. Prior to this role, Brian worked as a Senior Engineer at Qualcomm, where they enhanced MBIST diagnostic quality and conducted yield analysis for advanced technologies. Their previous experience also includes a position as a Senior Member of Technical Staff at AMD, focusing on analyzing defects in advanced nodes. Brian has been instrumental in DFT methodologies for cutting-edge products, including the world’s first 3nm GAA technology.