Jared Eisenhower

Jared Eisenhower is a seasoned engineering professional with extensive experience in failure analysis across multiple industries. Currently serving as a Senior Failure Analysis Engineer at Broadcom Inc. since December 2019, Jared previously held positions at Axon, where responsibilities included validating new product designs and spearheading failure analysis initiatives. Prior to that, significant contributions were made at Medtronic from December 2015 to May 2019, focusing on analyzing medical devices and integrated circuits, enhancing product quality, and developing new methodologies. Earlier experience includes roles at Microchip Technology, where Jared evaluated components to determine failure causes, and internships at Medtronic and Lockheed Martin, which provided foundational skills in test validation and software testing. Educational background includes a Bachelor of Science in Electrical and Electronics Engineering from Arizona State University. Jared has also been granted a Department of Defense Secret Security Clearance.