John Shu is a seasoned engineering professional with extensive experience in test development roles, currently serving as a Principal Test Development Engineer at Broadcom Inc. since February 2017. Prior positions include Principal Test Development Engineer at ON Semiconductor and a series of roles at Broadcom Inc., Teradyne, Aptina Imaging, and AltaSens, with a background that encompasses both engineering management and application engineering. John Shu holds a Bachelor of Science in Electrical and Computer Engineering from UC Santa Barbara, awarded in 1991.
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