Jordan Davis

Jordan Davis currently serves as the Silicon Photonic R&D Die Level Test Lead at Broadcom, overseeing die level testing for silicon photonic co-packaged optics. Prior experience includes the role of R&D Optical Test Engineer at Intel Corporation, where Jordan developed testing methodologies for silicon photonic components, and a graduate student at the University of California, San Diego, focusing on hybrid laser development and the fabrication of silicon photonic devices. Additional roles at Intel Corporation as a Design Engineering Intern and prior research experiences at Cornell University and UC San Diego contributed to a robust understanding of photonics and optical waveguides. Jordan holds a PhD in Electrical & Computer Engineering with a specialization in Photonics from UC San Diego and a Bachelor of Science in Electrical & Computer Engineering from Cornell University.