Leow Chee Siang is a Senior Test Engineer at Broadcom Limited, where they work on WLCSP and WLBGA dies, focusing on reducing test times and improving yield based on production data. Previously, Leow served as a Product/Test Engineer at IDT from 2010 to 2016, where they gained expertise in product performance analysis, bench test verification, and yield trend monitoring. Leow holds a Bachelor of Engineering in Electrical, Electronics and Communications Engineering from Sheffield Hallam University and an Advanced Diploma in Electrical and Electronics Engineering from Kolej Tunku Abdul Rahman.
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