Sim Loo is a Principal R&D Engineer at Broadcom, where they specialize in device and chip-level leakage modeling, IV/CV characterization, and test automation. They have extensive experience with tools such as ICCAP, HSPICE, and Cadence Virtuoso, and have worked on power-performance benchmarking and chip power management. Prior to their current role, Sim was a Device Modeler at IBM, contributing to leakage model development, and they served as a Research and Development Engineer, leading technology benchmarking for low power technologies. Sim holds a PhD and a Master's degree in Electrical Engineering from Michigan State University and is currently pursuing a Bachelor's degree in the same field.
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