Yan Duan is a Senior Product Engineer at Broadcom Inc., where they conduct comprehensive analyses of foundry PCM data and oversee reliability testing for photodetectors. Previously, they served as an R&D Test Engineer at Broadcom Inc. and as a Test & Development Engineer at Cosemi Technologies Inc., focusing on RF and optical testing of photodiode chips. Yan earned their Master of Science in Mechanical Engineering from Washington State University, where they published three first-author journal articles, and holds a Bachelor of Science in Electrical Engineering from the University of Shanghai for Science and Technology. With a robust background in semiconductor engineering, Yan excels in project management, data analysis, and cross-team collaboration.
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