Yen Nguyen is a dedicated R&D Test Engineer at Broadcom, where they have led the development and deployment of DVT and compliance tests for WiFi SISO/MIMO devices since 2010. Yen manages and coordinates projects related to firmware and driver releases, enhances test coverage, and supports validation efforts for WLAN chip products. Prior to their current role, they worked as a Senior Device Modeling Engineer at National Semiconductor, focusing on high-performance bipolar transistors and automated RF measurements. Yen holds a Bachelor of Science degree from San Jose State University and has extensive experience in RF characterization and test methodologies.
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