Test chips, test elements, test structures and monitor wafers for thin film characterization. Speciaized for ALD/CVD process development and monitoring support. Market leader in conformality test chips. PillarHall LHAR4 test chip products.

Manufacturing

Materials

Nanotechnology

Semiconductor

Test & Measurement

Chipmetrics

Mikko Utriainen

Stefan Polzin

Feng Gao

Jenni Backholm

This department oversees the overall strategy and management of the organization.

Executive Leadership

This department focuses on the analysis and measurement of thin films and wafer technologies to ensure precision and quality in semiconductor applications.

Thin Film and Metrology

Chipmetrics

Org chart

Teams

Executive Leadership

Thin Film and Metrology

Offices

Chipmetrics

Org chart

Teams

Executive Leadership

Thin Film and Metrology

Offices

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