Jeff Wheeldon is a Senior Manager in Chip Test and Measurement at Ciena, where they currently oversee the test and measurement team within the photonic integrated chip development group. With sixteen years of experience as a designer and researcher of optical systems and semiconductor devices, they are a complex problem solver known for proficiency in numerical and analytical modeling. Jeff previously held positions at esteemed institutions and companies, including the University of Ottawa as a Ph.D. student, postdoctoral fellow, and part-time professor, along with roles at JDS Uniphase and RANOVUS Inc. They co-invented two patents and have made significant contributions to the field through numerous publications and presentations. Jeff earned a Bachelor of Science in Physics from the University of Waterloo and a Ph.D. in Physics from the University of Ottawa.
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