David E. Baker is a Senior Research Scientist at Corning Incorporated, with over two decades of experience specializing in electron probe microanalysis, scanning electron microscopy, and x-ray microanalysis since joining the company in October 2000. Prior to this role, David served as a Technician Specialist at WR Grace, where expertise included electron microscopy, atomic force microscopy, and various forms of spectroscopy from February 1990 to September 2000. David holds a Bachelor's degree in Glass Engineering Science from Alfred University, obtained between 2007 and 2014, and an Associate of Arts and Sciences (A.A.S.) degree in Chemical Technology from Alfred State College - SUNY College of Technology, completed from 1987 to 1989.
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