Bern Keo is a seasoned Mfg. Test Engineer with extensive experience in the aerospace and electronics industries. Currently holding the position of Mfg. Test Engineer IV at Crane Aerospace & Electronics since February 2021, Bern specializes in supporting In-Circuit Test (ICT) and Flying Probe Test, encompassing both hardware and software components. Prior experience includes serving as Mfg. Test Engineer II at AvtechTyee from November 2012 to September 2020, where Bern contributed to the design and manufacture of electronic systems for aerospace applications. Additionally, Bern worked as Mfg. Test Engineer Sr. at Intermec by Honeywell for over two decades, providing technical support, developing test fixtures, and standardizing test methods to enhance product quality. Educational qualifications include a Bachelor of Science in Computer Systems with a focus on C and C++ Programming from City University of Seattle, as well as an Associate of Science in Electronics from North Seattle College.
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