Frank Hanhoff is a Principal DFT Engineer at Cyient, where they focus on advanced design-for-test strategies. Previously, they served as an Engineering Manager at Intel Corporation, leading a team in test methodology and innovation, and also held roles at Siemens and Infineon Technologies, developing digital circuits and improving testability measures. Frank started their career as a Development Engineer at mikron AG, specializing in mixed-signal ASIC designs. They earned a Diplom-Ingenieur in Electrical Engineering with a focus on Automation Technology from Märkische Fachhochschule Iserlohn.
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