Jerome Crocco

Jerome Crocco is the dpiX Chief Technology Officer, reporting to CEO Frank Caris. Jerome joined dpiX in 2015 and has worked as a research & optical modelling engineer, Fab Yield Manager, as well as customer liaison for design, NPI, and Production related issues. The manufacturing and development issues which arise from time to time can be challenging, but with support of dpiX solid engineering staff, Jerome has enjoyed working alongside as well as leading some of these key projects.

Prior to joining dpiX, Jerome travelled to and worked across several continents with an emphasis on X-ray detection and sensor development. His PhD studies carried out at the Autonomous University of Madrid emphasized large volume crystal growth and detector fabrication of room temperature CdZnTe spectrometers for medical imaging applications.