Joel Irby

Joel Irby has extensive experience in design for testability (DFT) across multiple leading technology companies. Currently serving as a DFT Consultant at Draper since April 2023, Joel is responsible for integrating various DFT features, including memory built-in self-test (MBIST) and boundary scan. Previously, Joel worked at Microsoft as a DFT Consultant focused on design-rule-check analysis and simulation-based verification. Other notable roles include Principal DFT Engineer at Flex Logix Technologies, Inc., where Joel designed and verified hierarchical DFT hardware, and Principal Member of Technical Staff at AMD, concentrating on DFT insertion using both EDA tools and in-house IP. Joel's career also includes significant contributions at Arm in both DFT engineering and patent developments, and earlier roles at Qualcomm, AMD, Motorola Semiconductor, and Texas Instruments, where foundational contributions to test program development and software for test vectors were made. Joel holds a Master's and Bachelor's degree in Engineering and Electrical and Electronics Engineering from The University of Texas at Austin.