John Smith

John Smith is an experienced engineering professional specializing in test development, with a career spanning over four decades. Currently serving as Principal Test Development Engineer at Dukosi since January 2022, John previously held the same title at Dialog Semiconductor. John's extensive background includes a role as Staff Test Development Engineer at Analog Devices from December 2006 to September 2016, focusing on test development in power management products. John's career began at National Semiconductor, where John worked as a Test Development Engineer from August 1982 until December 2006.