Viet Vu is a Principal Engineer I at EF Johnson Technologies, Inc., since March 2006, specializing in P25 CAP testing and serving as an EFJohnson P26 CAP Authorized Representative. Expertise includes TIA/FCC RF testing, RF design, LabView and C# programming, along with experience in designing automated test equipment for RF performance. Previous roles include Senior Design and Test Engineer and Senior RF Design Engineer at Mustang Technology Group and RF Design Engineer positions at Nokia from 1995 to 2006. Viet Vu holds a Master of Science degree in Electrical, Electronics, and Communications Engineering from The University of Texas at Arlington, completed in 1999.
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