Four Dimensions manufactures advanced semiconductor probing systems since 1978. Our Four Point Probe and CVmap systems are found in hundreds of fabs and research institutions around the world. 

Products:

We provide four point probes with an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring PN junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing. 

Four-Point Probe:

 - extended measurement range
 - high compliance voltage (enables measuring high resistivity thicker sample)
 - partial wafer mapping
 - very user-friendly software

We offer the widest range of Mercury probe geometries and special capacitance measurement electronics. This permits our systems to probe and characterize a wide range of materials, including semi-conductors, oxides, dielectrics, SOI ( silicon on insulator ), and films on conducting or insulating substrates.

CVmap:

 - safe design (contact from below)
 - special designed spill proof mercury reservoir
 - excellent contact area repeatability
 - more than one con contact area on the front side
 - refreshing mercury 9refreshes mercury before each contact)
 - easy to replace parts and mercury
 - compact design (small footprint)
 - only need to change mercury twice a year
 - offer the widest range of contact areas and probe head configurations
 - no frequent calibration needed
 - very user-friendly software

Four Dimensions, Inc.

Org chart

Teams

Offices