Peter Chi

Peter Chi is a Principal Failure/Device Analysis Engineer at GLOBALFOUNDRIES, where they have been responsible for measurement and quantification using advanced microscopy tools since 2011. Prior to this role, they worked as a physicist at the National Institute of Standards and Technology from 1984 to 2006, contributing to research on semiconductor impurities and authoring over 50 publications. Peter earned a Master’s degree in Physics from Rensselaer Polytechnic Institute and a Bachelor’s degree in Chemistry from the State University of New York at Albany.