Jifa Hao is an accomplished professional with over 25 years of experience in reliability R&D, technology development, and device/process development in power devices and analog IC. They currently serve as a TPU/GPU/CPU and GaN/SiC Reliability Staff Engineer at Google and hold the position of Adjunct Professor at Penn State University. Jifa has been a technical leader in developing reliability test structures and methodologies for power devices, successfully resolving numerous reliability and process issues. They are the main inventor of 11 issued US patents and have authored over 50 journal and conference publications. Jifa's leadership roles include serving as President of the IEEE Maine Electron Device/Solid State Circuit Societies and active participation in various technical committees.
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