Yoav Yarden is a DFT Engineer at Google since August 2025, following a role as a Chip Design DFT Engineer at Intel Corporation from October 2023 to August 2025, where expertise in SoC design and Scan DFT methodologies was developed. Prior experience includes a QA position at Omnisys in June 2020 and a student role at Intel Corporation in DFT Scan. Educational background includes a B.Sc in Electronic Engineering with a focus on VLSI Computers and Signal Processing from Tel Aviv University (2019-2023), and currently pursuing an MBA in Global Management at Tel Aviv University (2023-2025).
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