Sam Joseph is currently the Metrology Manager at Hemlock Semiconductor, where they standardize the Measurement System Analysis program and oversee the calibration of analytical instruments. Previously, Sam held various roles at Dow Corning, including Six Sigma Black Belt and Process Analyst, and at Hemlock Semiconductor, where they served as a Senior S&T Specialist and Quality Engineer. Sam earned a BS in Engineering and Technology Management from Saginaw Valley State University and has a strong background in quality management and data analytics. They have extensive experience in the semiconductor industry, contributing to process improvement and quality assurance initiatives.
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