Carl Yang is an experienced Senior Failure Analysis Engineer currently focused on semiconductor failure analysis at Hisilicon. They have a demonstrated history in the industry, having previously worked at Micron Technology and HJTC, where they specialized in failure analysis techniques and root cause analysis for various products. Carl holds a Master of Engineering in IC Device & Process from Fudan University and a Bachelor's degree in Electronic Science & Engineering from Southeast University. Their skills encompass application-specific integrated circuits, integrated circuits, electronics, and CMOS technology.
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