David Braunstein is an experienced engineer and scientist with a robust background in materials characterization and scanning probe microscopy. With a PhD in Physics from the University of Illinois Urbana-Champaign, David's career includes roles at leading companies such as IBM, Xerox, and HGST, where contributions spanned product development, failure analysis, and advanced materials research. Notable achievements include the development of new scanning probe microscopy products and the execution of various advanced testing methodologies. David's expertise also encompasses the interpretation of complex data for thin film development and the characterization of semiconductor devices.
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