James Stathis has extensive experience in technical strategy and research within the field of microelectronics. Since joining IBM in January 1986, James has played a pivotal role in driving technical strategy for proposal development, serving as Principal Investigator on multiple Department of Defense-funded programs. As a Principal Research Staff Member, James has managed a skilled group of researchers specializing in electrical characterization and transistor reliability, earning a promotion in September 2014. Additionally, James holds significant positions in influential organizations, including serving on the Board of Directors and as General Chair for the International Reliability Physics Symposium, as well as fulfilling the role of Associate Editor for Microelectronics Reliability at Elsevier. James earned a Ph.D. in Physics from the Massachusetts Institute of Technology and an A.B. in Physics from Washington University in St. Louis.
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