Katherine Sieg is a skilled semiconductor metrology tool owner with extensive experience in material and metrology engineering. They have worked across various roles, including positions at Ivy League institutions and leading tech companies such as Intel and IBM, focusing on thin film processing, ceramic igniter development, and metrology applications. Katherine holds a BS in Ceramic Engineering from Alfred University and an MS in Material Science and Engineering from Dartmouth College. Their expertise encompasses a broad range of material characterization techniques and data analysis methods, with a keen interest in materials research and programming development.
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