Liying Jiang has extensive experience in the field of metrology and semiconductor research. Currently serving as a Manager in Metrology at IBM since January 2019, Liying previously held the position of Metrology and Characterization Engineer at the same company from September 2014 to January 2019, where responsibilities included failure analysis and support for advanced transistor development programs. Prior to joining IBM, Liying worked as a Research Assistant at Arizona State University from 2009 to May 2014, focusing on the relationship between structure and properties of semiconductor alloys during Ph.D. studies. Liying earned a Doctor of Philosophy (Ph.D.) at Arizona State University, with a thesis on the structural characterization and optical properties of semiconductors, and completed a Bachelor of Science in Physics at Nankai University, where research focused on the luminescence properties of near-infrared in oxyfluoride glass ceramics.
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